Verification calculations
Verification_1 (deprecated),
Verification_2 (deprecated),
Verification_3, reflection off material with real index of refraction(k equal to 0), centered at 55 deg,
Verification_4, reflection off material with complex index of refraction (n and k not equal to 0), centered at 55 deg,
Verification_5 (deprecated),
Verification_6 (deprecated),
Verification_7, mode matching with d1 swept +/- 5 mm,
Verification_8, index of AlGaInAs at 1500 nm, various values of x,
Verification_9, index of InP at 980 nm,
Verification_10a:,0 deg incident angle, nondispersive substrate, non dispersive layer materials, centered around lambda=546 nm,
Verification_11a: 30 deg incident angle, nondispersive substrate, non dispersive layer materials, centered around lambda=546 nm,
Verification_12a: 30 deg incident angle, dispersive SF10 substrate, non dispersive layer materials, centered around lambda=546 nm,
Verification_13b: 30 deg incident angle, dispersive silicon substrate, non dispersive layer materials, centered around lambda=1047 nm,
Verification_14a: 30 deg incident angle, dispersive silicon substrate, dispersive layer materials Al and Ag, centered around lambda=1047 nm,
Verification_15a: 30 deg incident angle, nondispersive substrate, dispersive layer materials SiO2 and Au, centered around lambda=1000 nm + / - 720 nm,
Verification_16b: 30 deg incident angle, dispersive InP substrate, dispersive layer materials Al and Si, centered around lambda=850 nm + / - 120 nm,
Verification_17a: Polarization matrices
Verification_18a: Sio2a at 633 nm at 25 deg C