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14/Nov/2013: New material: added the index of refraction of aluminum doped Zinc oxide (AZO) from the Yi-Chih Wang, Bing-Yi Lin et al. "Photovoltaic electrical properties of aqueous grown ZnO antireflective nanostructure on Cu(In,Ga)Se2 thin film solar cells" reference. 'Aluminum-doped ZnO (AZO) is a promising transparent conductive oxide (TCO) material for the window layer of CIGSe devices due to its environmental friendly and low cost' per the ref.Available on the custom code entry input below.

9/Nov/2013: added "H"and "L" variables for thin film stack definition. This allows users to define more rapidly a series of high/low films for a stack, and makes it easier to adjust parameters. This also makes film entry more consistent with industry standard film notation.

19/Oct/2013: New material: added ITO layers fabricated from nanoparticle suspensions (from Baum, Alexeev et al ref. See coding guidelines for full ref). Layers fabricated from nanoparticles in this manner have residual porosity which leads to optical index of refraction values substantially different from those of the bulk material. This is of value for potential new low-cost methods for ITO layer generation. Available on the custom code entry input below.

2/Sep/2013: New material: added index of refraction for variable ratio silicon nitride, with the different stoichiometries of SiNx determined by the flow rate of the reactive gas, from the J. Kischkat, S. Peters et al. Oct/2012 Applied Optics article. Available on the custom code entry input below.

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