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16/Jun/2013: by popular demand: it is now possible to get multiple index of refraction values or execute other functions with a single query. A new input window (entitled "custom code") running simple code, along with a few custom functions, now gives the user the ability to specify exactly the desired values, along with output formatting. See the sample code for guidance.

16/May/2013: Feedback from Team Azad-1 Student satellite Project,MANIT,India (again): Can you consider adding a code to multilayer stack to calculate reflectivity for a given surface roughness.. we think there are some equation that can accurately model that..Reply: surface roughness on multilayer thin film stacks is a complex endevaour that will take time to set up. As a first small step, we have added calculations to model the impact of rough surfaces on the standard reflection calculation. The Kirchoff approximation is used to model surface roughness on reflection. This holds for small perturbations relative to wavelength, and large illumination perpendicular to the grooves. Thank you for the feedback.

23/Apr/2013 Feedback from ?? Change all inputs to metres Answer: this comes up a lot and requests vary. Most (though not all) users prefer nm inputs for wavelength inputs since putting the "e-9" to all lambdas is troublesome and error-prone. However, if there is a large number of requests for only metres then the policy can be changed.

18/Apr/2013 Feedback from Antony Galea (OIST): Plasma frequencies of common materials Ag, Au, etc. in vacuum would be a useful addition. Answer: good idea. Anyone with a good reference on these please forward and they can be put onto the site

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