19/Oct/2013: New material: added ITO layers fabricated from nanoparticle suspensions (from Baum, Alexeev et al ref. See coding guidelines for full ref). Layers fabricated from nanoparticles in this manner have residual porosity which leads to optical index of refraction values substantially different from those of the bulk material. This is of value for potential new low-cost methods for ITO layer generation. Available on the custom code entry input below.

2/Sep/2013: New material: added index of refraction for variable ratio silicon nitride, with the different stoichiometries of SiNx determined by the flow rate of the reactive gas, from the J. Kischkat, S. Peters et al. Oct/2012 Applied Optics article. Available on the custom code entry input below.

16/Jun/2013: by popular demand: it is now possible to get multiple index of refraction values or execute other functions with a single query. A new input window (entitled "custom code") running simple code, along with a few custom functions, now gives the user the ability to specify exactly the desired values, along with output formatting. See the sample code for guidance.

16/May/2013: Feedback from Team Azad-1 Student satellite Project,MANIT,India (again): Can you consider adding a code to multilayer stack to calculate reflectivity for a given surface roughness.. we think there are some equation that can accurately model that..Reply: surface roughness on multilayer thin film stacks is a complex endevaour that will take time to set up. As a first small step, we have added calculations to model the impact of rough surfaces on the standard reflection calculation. The Kirchoff approximation is used to model surface roughness on reflection. This holds for small perturbations relative to wavelength, and large illumination perpendicular to the grooves. Thank you for the feedback.

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